SICK AppSpace SensorApps - Intelligent Inspection
Model: Intelligent Inspection
Category: Artificial Intelligence
Exhibitor: SICK TAIWAN CO., LTD.
Booth No: S524
Characteristic
Solves complex machine vision applications with deep learning
The deep learning-powered Intelligent Inspection toolset from SICK enables powerful anomaly detection and object classification that is not possible with rule-based machine vision. The combination of an example-based approach with on-device training and user-friendly interface paves the way for simplified solution development. The anomaly detection and classification tools ensure that inspected items fulfill required quality and sorting demands, which helps to improve yield, reduce waste and increase customer satisfaction. In addition, all traditional rule-based machine vision software tools from Quality Inspection toolset are included.
At a glance
- Inspection by deep learning technology
- Anomaly detection tool and classification tool
- Runs on supported SICK vision sensors
- On-device or dStudio-based labeling, training and evaluation
- Web user interface
- Traditional rule-based machine vision software tools included
- SICK Nova Tools plug-in support
Your Benefits
- Deep learning solves complex machine vision applications where rule-based tools are insufficient
- Reduce waste and warranty claims and improve reliability and productivity
- Cost-efficient ownership as deep learning runs on device
- Fast and easy on-device application buildup as well as optimized accuracy and execution speed with training in SICK dStudio
- User-friendly and quick to learn
- Combined benefits from traditional rule-based tools with deep learning side-by-side
- Easily expand and customize functionality
more info:https://www.sick.com/tw/zf/sick-appspace/sick-appspace-sensorapps/intelligent-inspection/c/g551949
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