A.P.E-short-pulse measurement Autocorrelator-pulseCheck
Model: pulseCheck SM 2000
Category: Components & Parts
Exhibitor: SUPERBIN COMPANY, LTD.
Booth No: P001
Characteristic
Exchangeable Optics Sets for wavelength coverage from 200 nm to 12 μm
Wide range of sensitivity levels covered with PMT, PD, and TPA
High temporal resolution with a sampling resolution down to 50 attoseconds
Toggle between interferometric and intensity autocorrelation
Integrated Controller for data acquisition, data fitting, and fast FPGA data processing
Software aided wavelength tuning of crystal (phase matching)
Fully compliant with DIN 58175-2:2021-04 (pulse measurement)
NX-Software and USB as well as Ethernet connection
TCP/IP remote control with standardized command set for easy programming
Option: FROG for complete pulse characterization
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